esp-idf/components/soc/esp32p4/include/soc/usb_wrap_struct.h

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5.9 KiB
C

/**
* SPDX-FileCopyrightText: 2023-2024 Espressif Systems (Shanghai) CO LTD
*
* SPDX-License-Identifier: Apache-2.0
*/
#pragma once
#include <stdint.h>
#ifdef __cplusplus
extern "C" {
#endif
/** Group: USB wrapper registers. */
/** Type of otg_conf register
* USB wrapper configuration registers.
*/
typedef union {
struct {
/** srp_sessend_override : R/W; bitpos: [0]; default: 0;
* This bit is used to enable the software over-ride of srp session end signal. 1'b0:
* the signal is controlled by the chip input, 1'b1: the signal is controlled by the
* software.
*/
uint32_t srp_sessend_override:1;
/** srp_sessend_value : R/W; bitpos: [1]; default: 0;
* Software over-ride value of srp session end signal.
*/
uint32_t srp_sessend_value:1;
/** phy_sel : R/W; bitpos: [2]; default: 0;
* Select internal external PHY. 1'b0: Select internal PHY, 1'b1: Select external PHY.
*/
uint32_t phy_sel:1;
/** dfifo_force_pd : R/W; bitpos: [3]; default: 0;
* Force the dfifo to go into low power mode. The data in dfifo will not lost.
*/
uint32_t dfifo_force_pd:1;
/** dbnce_fltr_bypass : R/W; bitpos: [4]; default: 0;
* Bypass Debounce filters for avalid,bvalid,vbusvalid,session end, id signals
*/
uint32_t dbnce_fltr_bypass:1;
/** exchg_pins_override : R/W; bitpos: [5]; default: 0;
* Enable software controlle USB D+ D- exchange
*/
uint32_t exchg_pins_override:1;
/** exchg_pins : R/W; bitpos: [6]; default: 0;
* USB D+ D- exchange. 1'b0: don't change, 1'b1: exchange D+ D-.
*/
uint32_t exchg_pins:1;
/** vrefh : R/W; bitpos: [8:7]; default: 0;
* Control single-end input high threshold,1.76V to 2V, step 80mV.
*/
uint32_t vrefh:2;
/** vrefl : R/W; bitpos: [10:9]; default: 0;
* Control single-end input low threshold,0.8V to 1.04V, step 80mV.
*/
uint32_t vrefl:2;
/** vref_override : R/W; bitpos: [11]; default: 0;
* Enable software controlle input threshold.
*/
uint32_t vref_override:1;
/** pad_pull_override : R/W; bitpos: [12]; default: 0;
* Enable software controlle USB D+ D- pullup pulldown.
*/
uint32_t pad_pull_override:1;
/** dp_pullup : R/W; bitpos: [13]; default: 0;
* Controlle USB D+ pullup.
*/
uint32_t dp_pullup:1;
/** dp_pulldown : R/W; bitpos: [14]; default: 0;
* Controlle USB D+ pulldown.
*/
uint32_t dp_pulldown:1;
/** dm_pullup : R/W; bitpos: [15]; default: 0;
* Controlle USB D+ pullup.
*/
uint32_t dm_pullup:1;
/** dm_pulldown : R/W; bitpos: [16]; default: 0;
* Controlle USB D+ pulldown.
*/
uint32_t dm_pulldown:1;
/** pullup_value : R/W; bitpos: [17]; default: 0;
* Controlle pullup value. 1'b0: typical value is 2.4K, 1'b1: typical value is 1.2K.
*/
uint32_t pullup_value:1;
/** usb_pad_enable : R/W; bitpos: [18]; default: 0;
* Enable USB pad function.
*/
uint32_t usb_pad_enable:1;
/** ahb_clk_force_on : R/W; bitpos: [19]; default: 0;
* Force ahb clock always on.
*/
uint32_t ahb_clk_force_on:1;
/** phy_clk_force_on : R/W; bitpos: [20]; default: 1;
* Force phy clock always on.
*/
uint32_t phy_clk_force_on:1;
/** phy_tx_edge_sel : R/W; bitpos: [21]; default: 0;
* Select PHY tx signal output clock edge.1'b0: negedge;1'b1: posedge.
*/
uint32_t phy_tx_edge_sel:1;
/** dfifo_force_pu : R/W; bitpos: [22]; default: 0;
* Disable the dfifo to go into low power mode. The data in dfifo will not lost.
*/
uint32_t dfifo_force_pu:1;
uint32_t reserved_23:8;
/** clk_en : R/W; bitpos: [31]; default: 0;
* Disable auto clock gating of CSR registers.
*/
uint32_t clk_en:1;
};
uint32_t val;
} usb_wrap_otg_conf_reg_t;
/** Type of test_conf register
* TEST relative configuration registers.
*/
typedef union {
struct {
/** test_enable : R/W; bitpos: [0]; default: 0;
* Enable to test the USB pad.
*/
uint32_t test_enable:1;
/** test_usb_wrap_oe : R/W; bitpos: [1]; default: 0;
* USB pad one in test.
*/
uint32_t test_usb_wrap_oe:1;
/** test_tx_dp : R/W; bitpos: [2]; default: 0;
* USB D+ tx value in test.
*/
uint32_t test_tx_dp:1;
/** test_tx_dm : R/W; bitpos: [3]; default: 0;
* USB D- tx value in test.
*/
uint32_t test_tx_dm:1;
/** test_rx_rcv : RO; bitpos: [4]; default: 0;
* USB differential rx value in test.
*/
uint32_t test_rx_rcv:1;
/** test_rx_dp : RO; bitpos: [5]; default: 0;
* USB D+ rx value in test.
*/
uint32_t test_rx_dp:1;
/** test_rx_dm : RO; bitpos: [6]; default: 0;
* USB D- rx value in test.
*/
uint32_t test_rx_dm:1;
uint32_t reserved_7:25;
};
uint32_t val;
} usb_wrap_test_conf_reg_t;
/** Type of date register
* Date register.
*/
typedef union {
struct {
/** usb_wrap_date : HRO; bitpos: [31:0]; default: 587400452;
* Date register.
*/
uint32_t usb_wrap_date:32;
};
uint32_t val;
} usb_wrap_date_reg_t;
typedef struct usb_wrap_dev_t {
volatile usb_wrap_otg_conf_reg_t otg_conf;
volatile usb_wrap_test_conf_reg_t test_conf;
uint32_t reserved_008[253];
volatile usb_wrap_date_reg_t date;
} usb_wrap_dev_t;
extern usb_wrap_dev_t USB_WRAP;
#ifndef __cplusplus
_Static_assert(sizeof(usb_wrap_dev_t) == 0x400, "Invalid size of usb_wrap_dev_t structure");
#endif
#ifdef __cplusplus
}
#endif